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Journal ArticleOPEN ACCESS

High-resolution Z-contrast Imaging by the HAADF-STEM Method

  • SAITOH K
Nihon Kessho Gakkaishi (2005) 47(1) 9-14
DOI: 10.5940/jcrsj.47.9
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Abstract

Characteristic features of the high-angle annular dark-field scanning transmission electron microscope method are described from an experimental viewpoint. Examples of experimental HAADF-STEM images are shown.

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SAITOH, K. (2005). High-resolution Z-contrast Imaging by the HAADF-STEM Method. Nihon Kessho Gakkaishi, 47(1), 9–14. https://doi.org/10.5940/jcrsj.47.9

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