Investigations of surface characterization of silicone rubber due to tracking phenomena under a.c. and d.c. voltages

Abstract

In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric differential thermal analysis (TG-DTA) studies. The tracking time was different for a.c. and d.c. voltages.