Abstract
2nd ed. New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998.
Cite
CITATION STYLE
APA
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. (2007). Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Springer US. https://doi.org/10.1007/0-387-46547-2
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