Tip–Sample Interactions as a Function of Distance on Insulating Surfaces

Abstract

Recent advances in the measurement methods of scanning force microscopy (SFM) in the dynamic mode allow experimental access to site-specific short range forces. Either the tip is moved to a particular site, or the full three-dimensional frequency shift field of the oscillating tip is recorded while scanning a small surface area. Then the frequency shift is converted to force, and the long-range forces are fit by models and subtracted. The remaining short-range forces measured on a well- known surface CaF2 (111) can be used to learn more about the tip structure and chemical composition. On NaCl (001)-type crystal surfaces, where there is a complete symmetry of the local distribution of the positive and negative charge, the measurement of the force as a function of distance allows to unambiguously identify the positively and negatively charged sublattices on the surface. If additionally, the full three-dimensional force field is measured, information about the chemical nature of the tip-terminating cluster and about lateral forces are obtained. SFM measurements of site-specific force–distance curves further allow a deeper insight into mechanisms of energy dissipation at tips and surfaces.