Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Cite
CITATION STYLE
APA
Gazda, J., Duarte, J., & Daby-Merrill, F. (2010). Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices. Microscopy and Microanalysis, 16(S2), 230–231. https://doi.org/10.1017/s1431927610059957
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