Skip to main content
Book Chapter

Sampling and the Fast Fourier Transform

  • Kirkland E
Springer US, (2010), 61-76
DOI: 10.1007/978-1-4419-6533-2_4
N/ACitations
Citations of this article
2Readers
Mendeley users who have this article in their library.
Get full text

Cite

CITATION STYLE

APA

Kirkland, E. J. (2010). Sampling and the Fast Fourier Transform. In Advanced Computing in Electron Microscopy (pp. 61–76). Springer US. https://doi.org/10.1007/978-1-4419-6533-2_4

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free