Machine condition monitoring (MCM) has become an important tool to avoid sudden machine breakdown and gaining more economic profits. Tasks including early fault detection and monotonic degradation assessment are important in MCM. For the incipient fault detection, statistics such as kurtosis, Gini index are widely utilized, but they cannot give an accurately incipient fault detection time, and many fluctuations may exhibit. For the monotonic degradation assessment, root-mean-square are commonly used, however, it is sensitive to energy, and cannot show distinct degradation tendency in an early fault state. Those drawbacks have limited the development of practical MCM algorithms. To address those issues, this paper proposed four parameterized statistics for simultaneously early fault detection and monotonic degradation assessment. The four parameterized statistics can be health indicators and simplify the MCM algorithms, which can be beneficial to the practical MCM applications.
CITATION STYLE
Hou, B., Chen, Y., Deng, Y., Wang, Y., & Wang, D. (2021). New statistics for simultaneously machine incipient fault detection and monotonic degradation assessment. In Journal of Physics: Conference Series (Vol. 1983). IOP Publishing Ltd. https://doi.org/10.1088/1742-6596/1983/1/012112
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