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Nanoscaled Electrical Characterization

  • Celano U
DOI: 10.1007/978-3-319-39531-9_3
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Abstract

Abstract In this chapter the reader is introduced to the basic concepts that allow the analysis of electrical properties at the nanoscale using scanning probe microscopy (SPM). While not aiming to entirely cover the wide literature on atomic force microscopy (AFM), this chapter ...

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APA

Celano, U. (2016). Nanoscaled Electrical Characterization (pp. 47–86). https://doi.org/10.1007/978-3-319-39531-9_3

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