Tribological aspects of in situ manipulation of nanostructures inside scanning electron microscope

Abstract

This chapter is dedicated to manipulation of nanostructures inside a scanning electron (SEM) microscope employed for real-time tribological measurements. Different approaches to force registration and calculation of static and kinetic friction are described. Application of the considered methodology to Au and Ag nanoparticles, as well as ZnO and CuO nanowires, is demonstrated. Advantages and limitations of the methodology in comparison to traditional AFM-based manipulation techniques are discussed.