CITATION STYLE
Moers, M. H. P., Tack, R. G., Noordman, O. F. J., Segerink, F. B., Hulst, N. F., & Bölger, B. (1993). Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes. In Near Field Optics (pp. 79–86). Springer Netherlands. https://doi.org/10.1007/978-94-011-1978-8_10
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