Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels

  • Matulionis A
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Abstract

Microwave noise technique is applied to study ultrafast correlations in AlGaN/GaN and AlN/GaN two-dimensional electron gas (2DEG) channels subjected to a strong electric field applied in the plane of electron confinement. The experimental data are discussed in terms of hot-electron-energy dissipation on phonons, longitudinal-optical (LO) phonon conversion into other phonon modes, and hot-electron deconfinement. At high electric fields, the hot-electron energy relaxation is limited by the LO-phonon conversion. The LO-phonon conversion lifetime is estimated to be 350 fs in AlGaN/GaN channel. The lifetime is a useful parameter for extrapolation of hot-electron temperature beyond the field range where it is available from microwave noise experiments. The extrapolated hot-electron temperature is used to discuss hot-electron deconfinement noise.

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Matulionis, A. (2006). Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels. In Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices (pp. 89–96). Kluwer Academic Publishers. https://doi.org/10.1007/1-4020-2170-4_11

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