We derive high-order terms in the asymptotic expansions of boundary perturbations of steady-state voltage potentials resulting from small perturbations of the shape of a conductivity inclusion with C 2 {\mathcal C}^2 -boundary. Our derivation is rigorous and based on layer potential techniques. The asymptotic expansion in this paper is valid for C 1 {\mathcal C}^1 -perturbations and inclusions with extreme conductivities. It extends those already derived for small volume conductivity inclusions and leads us to very effective algorithms for determining lower-order Fourier coefficients of the shape perturbation of the inclusion based on boundary measurements. We perform some numerical experiments using the algorithm to test its effectiveness.
CITATION STYLE
Ammari, H., Kang, H., Lim, M., & Zribi, H. (2009). Conductivity interface problems. Part I: Small perturbations of an interface. Transactions of the American Mathematical Society, 362(5), 2435–2449. https://doi.org/10.1090/s0002-9947-09-04842-9
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