Mapping quantitative trait loci using distorted markers

Abstract

Quantitative trait locus (QTL) mapping is usually performed using markers that follow a Mendelian segregation ratio. We developed a new method of QTL mapping that can use markers with segregation distortion (non-Mendelian markers). An EM (expectation-maximization) algorithm is used to estimate QTL and SDL (segregation distortion loci) parameters. The joint analysis of QTL and SDL is particularly useful for selective genotyping. Application of the joint analysis is demonstrated using a real life data from a wheat QTL mapping experiment.