Simultaneous nc-afm/stm measurements with atomic resolution

Abstract

We discuss the history and recent progress of simultaneous AFM/STM measurements with atomic resolution. We demonstrate, that the technique can provide complex information about chemical and physical processes at atomic scale as well as about material properties of surfaces and nanostructures. We briefly overview one of the most fascinating achievements, high-resolution imaging with functionalized tips. The complexity of this technique calls for a new theoretical approach where relaxation of functionalized probe is considered in both AFM and STM modes. We describe mechanisms responsible for the high-resolution contrast introducing a numerical model, which provides deeper understanding of the AFM/STM measurements.