Abstract
Reliable measurement of the Seebeck coefficient requires painstaking precautions. Unfortunately, these requirements are not met even in commercially available equipment, and therefore the obtained data often contain systematic errors. We describe equipment for reliable Seebeck measurements and present results on YB66 and B4.3C boron carbide as an example. © 2009 IOP Publishing Ltd.
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CITATION STYLE
APA
Werheit, H., Kuhlmann, U., Herstell, B., & Winkelbauer, W. (2009). Reliable measurement of Seebeck coefficient in semiconductors. Journal of Physics: Conference Series, 176. https://doi.org/10.1088/1742-6596/176/1/012037
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