CITATION STYLE
Hosono, H., & Kawamura, K. (2000). INTERACTION OF SiO2 GLASSES WITH HIGH ENERGY ION BEAMS AND VACUUM UV EXCIMER LASER PULSES. In Defects in SiO2 and Related Dielectrics: Science and Technology (pp. 213–233). Springer Netherlands. https://doi.org/10.1007/978-94-010-0944-7_7
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