CITATION STYLE
Ottevaere, H., & Thienpont, H. (2009). Novel interferometric measurement systems for the characterization of micro-optics. In Fringe 2009 - 6th International Workshop on Advanced Optical Metrology (pp. 602–610). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-642-03051-2_103
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