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Book Chapter

TOPOLOGY AND TOPOLOGICAL DISORDER IN SILICA

  • Hobbs L
  • Yuan X
Springer Netherlands, (2000), 37-71
DOI: 10.1007/978-94-010-0944-7_2
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Hobbs, L. W., & Yuan, X. (2000). TOPOLOGY AND TOPOLOGICAL DISORDER IN SILICA. In Defects in SiO2 and Related Dielectrics: Science and Technology (pp. 37–71). Springer Netherlands. https://doi.org/10.1007/978-94-010-0944-7_2

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