Atomic force microscopy characterization of carbon nanotubes

Abstract

Carbon Nanotubes (CN) form a new class of materials that has attracted large interest in the scientific community because of their extraordinary properties (mechanical, electrical, thermal, etc.), as well as owing to the diversity of the proposed technological applications. The characterization of CN is the result of specific sample preparation procedures and requires the use of selected tools (e.g. SEM, HRTEM, EDX, Micro Raman, AFM, STM). We report some studies we carried out based on the CN characterization with the Atomic Force Microscopy (AFM). The general characteristics of the AFM employed and the sample preparation methods are illustrated. The research activities are focused on the development of specific analysis procedures. In fact, the interaction forces between the AFM cantilever tip and the sample, is the main parameter in the acquisition of a 3D topographic AFM micrograph. © 2007 IOP Publishing Ltd.