CITATION STYLE
Taplin, S. R., Podoleanu, A. Gh., Webb, D. J., Jackson, D. A., & Nattrass, S. R. (1997). Applications of Low Coherence Interferometry to Dynamic Oil Film Thickness Measurement. In Applications of Photonic Technology 2 (pp. 863–869). Springer US. https://doi.org/10.1007/978-1-4757-9250-8_130
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