Collecting 3D electron diffraction data by the rotation method

Abstract

A new method for collecting complete three-dimensional electron diffraction data is described. Diffraction data is collected by combining electron beam tilt at many very small steps, with rotation of the crystal in a few but large steps. A number of practical considerations are discussed, as well as advantages and disadvantages compared to other methods of collecting electron diffraction data. © Oldenbourg Wissenschaftsverlag, München.