Skip to main content
Journal Article

MEASUREMENTS.

CSIO Communications (Central Scientific Instruments Organization) (1982) 9(2-3) 52-60
DOI: 10.4324/9780203719213-7
0Citations
Citations of this article
4Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Some of the many optoelectronic techniques for measurements are briefly considered and several examples are given. The shortcomings and advantages of particular techniques for different purposes are pointed out. Some recommendations for metrological practices are given.

Cite

CITATION STYLE

APA

Vardhan, H. (1982). MEASUREMENTS. CSIO Communications (Central Scientific Instruments Organization), 9(2–3), 52–60. https://doi.org/10.4324/9780203719213-7

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free