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Journal ArticleOPEN ACCESS

Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope

  • Inada H
  • Tamura K
  • Nakamura K
  • et al.
Microscopy and Microanalysis (2011) 17(S2) 1298-1299
DOI: 10.1017/s1431927611007367
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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APA

Inada, H., Tamura, K., Nakamura, K., Suzuki, Y., Konno, M., Su, D., … Zhu, Y. (2011). Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 17(S2), 1298–1299. https://doi.org/10.1017/s1431927611007367

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