In this paper, we explore RF magnetron sputtered Phosphor-silicate-glass (PSG) film as a sacrificial layer in surface micromachining technology. For this purpose, a 76 mm diameter target of phosphorus-doped silicon dioxide was prepared by conventional solid-state reaction route using P2O5 and SiO2 powders. The PSG films were prepared in a RF (13·56 MHz) magnetron sputtering system at 300 watt RF power, 20 mTorr pressure and 45 mm target-to-substrate spacing without external substrate heating. Microstructures of sputtered silicon dioxide film were fabricated using sputtered PSG film as sacrificial layer in surface micromachining process. © Printed in India.
CITATION STYLE
Bhatt, V., Chandra, S., & Singh, C. (2009). Microstructures using RF sputtered PSG film as a sacrificial layer in sufface micromachining. Sadhana - Academy Proceedings in Engineering Sciences, 34(4), 557–562. https://doi.org/10.1007/s12046-009-0033-x
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