Abstract
The creation of reliable instrumentation for performing complex reflectance and transmittance measurements of dielectrics, metals, and superconductors in the frequency range from 60 GHz to 1.5 THz is reported. The system allows continuous variation of the THz radiation incidence angle from 25° to 80° without major realignment of the optics and provides the signal-to-noise ratio of 1000:1. © 2001 American Institute of Physics.
Cite
CITATION STYLE
APA
Khazan, M., Meissner, R., & Wilke, I. (2001). Convertible transmission-reflection time-domain terahertz spectrometer. Review of Scientific Instruments, 72(8), 3427–3430. https://doi.org/10.1063/1.1384433
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