Abstract
One of the central difficulties of devising new nanostructures is to monitor characterization and manipulation processes at extreme dimensions. In that respect, scanning probe microscopes (SPMs) constitute an important class of experimental tools for imaging the local atomic, mechanical, electronic, and transport properties of samples at dimensions ranging from the mesoscale to the nanoscale. © 2007 Springer Science+Business Media, LLC.
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CITATION STYLE
APA
Meunier, V., & Lambin, P. (2007). Theory of scanning probe microscopy. In Scanning Probe Microscopy (Vol. 2, pp. 455–479). Springer New York. https://doi.org/10.1007/978-0-387-28668-6_17
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