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New method of the chemical state imaging by EPMA-EXEFS

Journal of Synchrotron Radiation (2001) 8(2) 334-335
DOI: 10.1107/S0909049500017222
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Abstract

A novel two dimensional imaging technique of the chemical bonding state was developed by combining the extended X-ray emission fine structure method with an electron probe X-ray microanalyzer mapping technology. With this method, chemical state images of some aluminum standard samples were obtained. It was confirmed that the obtained images provide correct information of chemical states.

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CITATION STYLE

APA

Watanabe, T., Kawano, A., Ueda, K., Umesaki, N., & Wakita, H. (2001). New method of the chemical state imaging by EPMA-EXEFS. Journal of Synchrotron Radiation, 8(2), 334–335. https://doi.org/10.1107/S0909049500017222

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