Quartz sensors in atomic force microscopy

Abstract

As an alternative to the most frequently used silicon cantilevers, quartz oscillators can be used as sensors in AFM. It is possible to obtain atomic resolution in FM atomic force microscopy using quartz sensors. These quartz sensors are characterized by a large spring constant (>1, 000 N/m). Both quartz tuning forks, which are used in wristwatches, as well as quartz needle oscillators can be used as sensors in AFM. An advantage of using quartz sensors is that the detection of the oscillation signal can be performed completely electrically, without any optical elements, like a laser diode, a lens, a fiber, or a photodiode being needed. This simplifies the experimental setup.