Scanning Probe Methods for Magnetic Imaging

Abstract

Previous chapters give an introduction to novel magnetic imaging methods based on the scanning tunneling microscope (STM) or on the scanning force microscope (SFM). While the STM is sensitive to the surface density of electronic states and to its spin dependence, the magnetic force microscope (MFM), as a special variant of the SFM, detects the magnetic stray field produced by a sample, or the response of the sample to the local stray field produced by the probe. The basic setup in tunneling or force microscopy establishes a unified experimental approach as the basis of all scanning probe methods (SPM). The present chapter summarizes the basic aspects underlying this approach, analyzes achievements as well as limitations, and introduces three additional SPM.