CITATION STYLE
Gai, P. L., & Boyes, E. D. (2009). A very high temperature (2000°C) stage for atomic resolution in situ ETEM. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 481–482). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_241
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