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Spectroscopic Ellipsometry in the Mid Infrared with a New Accessory Fitting into Standard Fourier-transform Spectrometers

  • Dittmar G
  • Röseler A
  • Richter U
  • et al.
Springer Vienna, (1997), 763-765
DOI: 10.1007/978-3-7091-6840-0_202
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Abstract

Spectroscopic ellipsometry in the mid and far infrared is a developing method for the characterization of bulk materials, thin-film and multilayer samples. A new and easy to use accessory is presented which combines the stages of spectroscopic ellipsometry

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APA

Dittmar, G., Röseler, A., Richter, U., & Wielsch, U. (1997). Spectroscopic Ellipsometry in the Mid Infrared with a New Accessory Fitting into Standard Fourier-transform Spectrometers. In Progress in Fourier Transform Spectroscopy (pp. 763–765). Springer Vienna. https://doi.org/10.1007/978-3-7091-6840-0_202

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