Metal Pillared Bentonite Synthesis and Its Characteristics Using X-Ray Diffraction

Abstract

Modification of bentonite by the Al/Fe metal oxide pillarization process was carried out with metal oxides. The bentonite pillars were successfully characterized using an X-Ray Diffraction (XRD) spectrophotometer. The results of XRD characterization showed the peak diffraction angle (2θ) in metal-pillared bentonite was 26.84° at 698.98 cps. Meanwhile, in thermally and chemically activated bentonite, the peak angles were marked at 20.64° and 26.7°. There is a shift in the peak angle after activation and pillarization. XRD patterns showed dioctahedral smectite and quartz accessory minerals.