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X-ray induced transient optical reflectivity for fs-X-ray/optical cross-correlation at Free-Electron Lasers

Springer Science and Business Media Deutschland GmbH, (2009), 137-139
DOI: 10.1007/978-3-540-95946-5_45
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Abstract

Using the high peak brilliance of the X-ray Free-Electron Laser at Hamburg, we have studied the X-ray pulse induced transient optical reflectivity on GaAs and establish a novel tool for fs X-ray/optical cross-correlation.

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Gahl, C., Azima, A., Beye, M., Deppe, M., Döbrich, K., Hasslinger, U., … Föhlisch, A. (2009). X-ray induced transient optical reflectivity for fs-X-ray/optical cross-correlation at Free-Electron Lasers. In Springer Series in Chemical Physics (Vol. 92, pp. 137–139). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-540-95946-5_45

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