Interfacial ultramorphology of single-step adhesives: Nanoleakage as a function of time

Abstract

The aim of this study was to examine the effectiveness of single-step self-etching adhesives in preventing nanoleakage over a 90-day water-storage period, and analyse the ultramorphological characteristics of resin-dentin interfaces. Three single-step self-etching adhesives were evaluated: Adper Prompt L-Pop - LP (3M ESPE), iBond - iB (Heraeus Kulzer), and Clearfil Tri-S Bond - S3 (Kuraray). Bonded specimens were sectioned into 0.9-mm thick slabs and stored in water for 1, 60 or 90 days. After the storage periods, a silver tracer solution was used to reveal nanometer-sized spaces and evidence of degradation within resin-dentin interfaces. Epoxy resin-embedded sections were prepared, and the interfaces observed with the TEM. Nanoleakage patterns were compared among adhesives and storage periods using image analysis software. Data were statistically analysed by two-way anova and Tukey test. Nanoleakage was observed in all resin-dentin interfaces produced by the single-step self-etching adhesives. Results showed that LP presented the lowest silver deposition means at 1 day. However, after 60 and 90 days, the area of silver deposition significantly increased for LP. iB presented intense silver deposition after 1 day and a small increase after 90 days. S3 presented the lowest silver deposition means after 60 and 90 days of water-storage. © 2007 Blackwell Publishing Ltd.