Abstract
Piezoresponse force microscopy and spectroscopy (PFM and PFS, respectively) refer to a family of scanning probe microscopy (SPM) techniques based on the coupling between electrical bias and mechanical response (electromechanical detection). PFM and PFS are broadly used for the characterization of piezoelectric and ferroelectric properties (domain structure, switching dynamics, etc.) at the nanometer scale and are also applicable to polar biological and macromolecular systems. PFM is closely related to electrochemical strain microscopy (ESM), an SPM method used for the characterization of ionic transport and electrochemical reactivity on the nanoscale in ionic conductors
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CITATION STYLE
Rodriguez, B. J., Kalinin, S. V., Pelegov, D., & Kholkin, A. L. (2015). Piezoresponse Force Microscopy and Spectroscopy. In Encyclopedia of Nanotechnology (pp. 1–12). Springer Netherlands. https://doi.org/10.1007/978-94-007-6178-0_43-2
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