Probabilistic models with more than one latent variable are designed to report profiles of skills or cognitive attributes. Testing programs want to offer additional information beyond what a single test score can provide using these skill profiles. Many recent approaches to skill profile models are limited to dichotomous data and have made use of computationally intensive estimation methods like the Markov chain Monte Carlo (MCMC), since standard maximum likelihood (ML) estimation techniques were deemed infeasible. This paper presents a class of general diagnostic models (GDMs) that can be estimated with customary ML techniques and applies to polytomous response variables as well as to skills with two or more proficiency levels. The model and the algorithm for estimating model parameters handles directly missing responses without the need of collapsing categories or recoding the data. Within the class of GDMs, compensatory as well as noncompensatory models may be specified. This report uses one member of this class of diagnostic models, a compensatory diagnostic model that is parameterized similar to the generalized partial credit model (GPCM). Many well-known models, such as uni- and multivariate versions of the Rasch model and the two parameter logistic item response theory (2PL-IRT) model, the GPCM, and the FACETS model, as well as a variety of skill profile models, are special cases of this member of the class of GDMs. This paper describes an algorithm that capitalizes on using tools from item response theory for scale linking, item fit, and parameter estimation. In addition to an introduction to the class of GDMs and to the partial credit instance of this class for dichotomous and polytomous skill profiles, this paper presents a parameter recovery study using simulated data and an application to real data from the field test for TOEFL® Internet-based testing (iBT).
CITATION STYLE
von Davier, M. (2005). A GENERAL DIAGNOSTIC MODEL APPLIED TO LANGUAGE TESTING DATA. ETS Research Report Series, 2005(2), i–35. https://doi.org/10.1002/j.2333-8504.2005.tb01993.x
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