CITATION STYLE
Wang, A., Van Aert, S., & Van Dyck, D. (2008). Argand plot: a sensitive fingerprint for electron channelling. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 167–168). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_84
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