Skip to main content
Book Chapter

Surface Profilometer

  • Tosa M
Springer Singapore, (2018), 679-682
DOI: 10.1007/978-981-10-6156-1_110
N/ACitations
Citations of this article
27Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Surface profilometer can measure profile of surface roughness, surface texture, surface waviness, surface step height, deposited thin film thickness, and so on by means of contacting and scanning a sharp stylus with a very small measurement force less than mN.

Cite

CITATION STYLE

APA

Tosa, M. (2018). Surface Profilometer. In Compendium of Surface and Interface Analysis (pp. 679–682). Springer Singapore. https://doi.org/10.1007/978-981-10-6156-1_110

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free