Determination of Binding Energy for Cu and Cu2o Based X-Ray Diffraction Spectrum

Abstract

Binding Energy of Cu and Cu2O was determined by using semi-emperical method based on X-ray diffraction (X-RD) spectra. Parameter Method 3 (PM3) single point method in hyperChem used to analysis Binding Energy of Cu and Cu2O. Cu was annealing at temperature 600°C, 800°C for 30 minutes to get the oxide form. X-RD use to obtain lattice and distance between neighbor atoms formed in the samples as input parameter for empirical method by using Material Analysis Using Diffraction (MAUD). The Binding Energy for Cu is -87,69 kcal/mol at room temperature (RT). The binding energy for Cu2O are -156.29 kcal/mol and - 159.36 kcal/mol, at 600°C and 800°C respectively. The advantage of the method used in this study is not required the input parameter of ionic energy interaction, which is very difficult to determine based on X-RD data. This mean, the method in this study is effectively and efficiently for determining the binding energy of element metal and their oxides.