Effect of reflection and refraction on NEXAFS spectra measured in TEY mode

Abstract

The evolution of near-edge X-ray absorption fine structure in the vicinity of the K-absorption edge of oxygen for HfO2 over a wide range of incidence angles is analyzed by simultaneous implementation of the total-electron-yield (TEY) method and X-ray reflection spectroscopy. It is established that the effect of refraction on the TEY spectrum is greater than that of reflection and extends into the angular region up to angles 2gθc. Within angles that are less than the critical angle, both the reflection and refraction strongly distort the shape of the TEY spectrum. Limitations of the technique for the calculation of optical constants from the reflection spectra using the Kramers-Kronig relation in the limited energy region in the vicinity of thresholds are discussed in detail.A study of the effect of reflection and refraction processes on the evolution of the total-electron-yield spectrum over a wide range of incidence angles including grazing angles is reported.