Toward ultrafast in situ X-ray studies of interfacial photoelectrochemistry

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Abstract

Picosecond time-resolved in situ X-ray absorption and X-ray photoelectron spectroscopy techniques for atomic site-specific real-time studies of interfacial photoelectrochemistry are developed at the Advanced Light Source (ALS). First experiments monitor electronic dynamics in films of dye-sensitized nanocrystals and at hematite-electrolyte interfaces.

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Neppl, S., Liu, Y. S., Wu, C. H., Shavorskiy, A., Zegkinoglou, I., Troy, T., … Gessner, O. (2015). Toward ultrafast in situ X-ray studies of interfacial photoelectrochemistry. In Springer Proceedings in Physics (Vol. 162, pp. 325–328). Springer Science and Business Media, LLC. https://doi.org/10.1007/978-3-319-13242-6_79

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