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A Prectical Approach to Understanding Surface Metrology and Its Applications

  • Brown C
Kluwer Academic Publishers, (2005), 1-10
DOI: 10.1007/0-306-47095-0_1
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Brown, C. A. (2005). A Prectical Approach to Understanding Surface Metrology and Its Applications. In Atomic Force Microscopy/Scanning Tunneling Microscopy 3 (pp. 1–10). Kluwer Academic Publishers. https://doi.org/10.1007/0-306-47095-0_1

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