Chapter 9 presented the procedures for performing quantitative electron probe x-ray microanalysis for the casef an ideal specimen. The ideal specimen surface is flat and highly polished to reduce surface roughness to a negligible level so that electron and x-ray...
CITATION STYLE
Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Lyman, C. E., Lifshin, E., … Michael, J. R. (2003). Special Topics in Electron Beam X-Ray Microanalysis. In Scanning Electron Microscopy and X-ray Microanalysis (pp. 453–536). Springer US. https://doi.org/10.1007/978-1-4615-0215-9_10
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