Visible and infrared image registration employing line-based geometric analysis

Abstract

We present a new method to register a pair of visible (ViS) and infrared (IR) images. Unlike most of existing systems that align interest points of two images, we align lines derived from edge pixels, because the interest points extracted from both images are not always identical, but most major edges detected from one image do appear in another image. To solve feature matching problem, we emphasize the geometric structure alignment of features (lines), instead of descriptor-based individual feature matching. This is due to the fact that image properties and patch statistics of corresponding features might be quite different, especially when one compares ViS image with long wave IR images (thermal information). However, the spatial layout of features for both images always preserves consistency. The last step of our algorithm is to compute the image transform matrix, given minimum 4 pairs of line correspondence. The comparative evaluation for algorithms demonstrates higher accuracy attained by our method when compared to the state-of-the-art approaches. © 2012 Springer-Verlag.