Accelerated life tests are often expensive and difficult to conduct. Failure time censoring is anticipated because some test units do not fail over the testing period even under the accelerated stress condition. Therefore, a test plan must be carefully designed to maximize …
CITATION STYLE
Pan, R., & Seo, K. (2019). An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring (pp. 331–346). https://doi.org/10.1007/978-3-030-20709-0_14
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