Abstract
This paper presents a theory of test coverage and generation from specifications written in EFSMs. We investigate a family of coverage criteria based on the information of control flow and data flow and characterize them in the branching time temporal logic CTL. We discuss the complexity of minimal cost test generation and describe a method for automatic test generation which employs the capability of model checkers to construct counterexamples. Our approach extends the range of applications of model checking from formal verification of finite state systems to test generation from finite state systems. © Springer-Verlag Berlin Heidelberg 2002.
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CITATION STYLE
Hong, H. S., Lee, I., Sokolsky, O., & Ural, H. (2002). A temporal logic based theory of test coverage and generation. In Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (Vol. 2280 LNCS, pp. 327–341). Springer Verlag. https://doi.org/10.1007/3-540-46002-0_23
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