Total electron-yield (TEY) detector for X-ray absorption spectroscopy in fluorescence mode

Abstract

A simple detector to record X-ray Absorption Fine Structure (XAFS) using the Total Electron Yield (TEY) measurement has been developed. This detector is suitable for conducting samples which cannot be made sufficiently thin to measure XAFS in transmission geometry. TEY detection is used for indirect absorption measurement in VUV and soft x-ray energy range. In VUV and soft x-ray range, TEY is carried out under ultra-high vacuum conditions. In this energy range, photons mainly interact with surface and the total yield of electrons from the sample is measured by measuring the sample current. However, as the photon energy increases, penetration depth increases and escape probability of electrons decreases leading to the reduction in escape probability of electron which in turn decreases measured current. To overcome this, we have developed a TEY setup, which can be employed for X-ray range above 5 KeV. The setup has been used to record the XAS of conducting bulk samples.