Skip to main content
Book Chapter

Strain Measurements and Mapping

  • Zuo J
  • Spence J
Springer New York, (2017), 553-580
DOI: 10.1007/978-1-4939-6607-3_16
N/ACitations
Citations of this article
6Readers
Mendeley users who have this article in their library.
Get full text

Abstract

The concepts of strain and stress were introduced in Chap.  15 . Direct measurements of strain and stress always rely on the measurement of deformation in a structure.

Cite

CITATION STYLE

APA

Zuo, J. M., & Spence, J. C. H. (2017). Strain Measurements and Mapping. In Advanced Transmission Electron Microscopy (pp. 553–580). Springer New York. https://doi.org/10.1007/978-1-4939-6607-3_16

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free