Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Cite
CITATION STYLE
APA
Miller, M., Russell, K., Hoelzer, D., Kovarik, L., Mills, M., Certain, A., & Allen, T. (2010). Atom Probe Tomography as a Tool for Characterizing Irradiated Materials. Microscopy and Microanalysis, 16(S2), 1602–1603. https://doi.org/10.1017/s1431927610055686
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