Black box model of integrated circuits for ESD behavioral simulation and industrial application case

Abstract

In order to design electronic products for Electro Static Discharges constraints, the use of simulation is fundamental. This is the only solution to justify the design and to manage properly the margin during the development. In order to do so, models are required and especially for the integrated circuits (IC). A Pspice model had been developed and validated for ESD performance prediction of IC implemented inside an electronic product. Nevertheless, the practical implementation of these modeling techniques for IC induced some issues, especially under Pspice, being the targeted tool for our simulation. Divergences issues during time domain simulation were frequently observed and sometimes irresolvable with model proposed in [1]. We propose in this article new implementation techniques in Pspice. A practical example is used to demonstrate the capability of our model.